Publikationen

1960-69, 1970-79, 1980-89, 1990-99, 2000 - heute

1960 - 69

H. Bradaczek
Ein Gerät zur selbständigen Aufzeichnung von Stehfeldisodosen
Fortschritte auf dem Gebiet der Röntgenstrahlen und der Nuklearmedizin
93 Heft 3 (1960)

H. Birkner, H. Bradaczek, F. Kossel u. K. Pohle
Ein Gerät zur vollautomatischen Isodosenermittlung bei Bewegungsstrahlen
Strahlentherapie 118 Heft 2 (1962)

H. Bradaczek
Theoretische Grundlagen zur Berechnung der Bestrahlungsdaten bei Co60-Pendelbestrahlung
Strahlentherapie 117 Heft 3 (1962)

H. Bradaczek, R. Hosemann
Präzisionsbestimmung der Elektronendichteverteilung
Vortrag: Physikertagung Stuttgart (1962)

H. Bradaczek
Evaluation of the Absorption Correction in Crystals by Reflexion Profile Analysis
Vortrag: Internat. Kristallographenkongress in Stony Brook, USA (1969)

1970 - 79

H. Bradaczek, P. Denzer, P. Luger
Realtime Oberservation of Changing Reflection Profiles
Vortrag: Intern. Kongress f. Kristallograohie, Kioto, Japan (1972)

H. Bradaczek
Ein rechnerorientiertes Strahlenmessgerät
Vortrag: Physikertagung Freudenstadt (1972)

H. Bradaczek, P. Denzer, P. Luger
Vidicon Diffractometer System for the Registration of X-Ray Reflection Profiles
Intern. Kongress f. Kristallographie, Kioto, Japan (1972)

H. Bradaczek, P. Luger
Direkte Vorzeichenbestimmung durch Faltungswurzel
Vortrag: Kristallographentagung Frankfurt (1973

H. Labischinski, H. Bradaczek
Fast Fourier Transform of Arbitrary Three Dimensional Models and ist Application
10th International Congress of Crystallography Amsterdam (1975)

H. Bradaczek
Gerneralized Functions in Diffraction Theory
Third European Crystallography Meeting Zürich (1976)

H. Bradaczek
New Development in X-Ray Measuring and Generating Devices
Vortragsaufenthalt Universität Leningrad (1976)

H. Bradaczek
Kristallographische Anwendung von Mikroprozessoren
16. Diskussionstagung der DMG, DPG und GDCH
Arbeitsgemeinschaft Kristallographie, Braunschweig (1976)

H. Labischinski, H. Bradaczek
A Computer Program using a Fast Fouriertransform Algorithm for the Calculation of X-ray Scattering Data from a Variety Model
J. Appl. Cryst. 10, 361-364 (1977)

H. Bradaczek, P. Luger
A Fast Converging Refinement of One Dimensional Convolution Square Roots
Acta Cryst A34, (1978)

H. Bradaczek, H.J. Hecht
Packungsanalyse von Kristallen durch Potentialrechnungen im Fourierraum
18. Diskussionstagung der AGKr, gem. mit der DGKK, Freudenstadt (1978)

H. Bradaczek
Fouriertransformation periodischer Funktionen - eine Anwendung des Fourierformalismus auf kristallographische Probleme
19. Diskussionstagung der AGKr der DMG, Aachen (1979)

1980 - 89

H. Bradaczek
Potential Energy Calculation of Molecular and Crystal Structures in Fourier Space
Journ. Phys. C: Solid State Phys. 14, 1-7 (1981)

H. Bradaczek, G. Barnickel, B. Leps
Reciprocal Sphere Potential Functions for Structural Energy Calculation
J. of Physics C: Solid State Physics, 16, 551-554 (1983)
H. Bradaczek, G. Hildebrandt, G. Jähnig u. J.D. Stephenson
Synchrotron X-Ray Topography Site at Hasylab
Nuclear Instruents and Methods 208 (1983) 719-721

G. Hildebrandt, W. Uebach. H. Bradaczek
Neuer Ansatz zur Optik mit Röntgenstrahlen unter Verwendung von Delta- Kristallen
Proceed. Arbeitskreis Röntgentopographie, pp. 50-56 (1988).

H. Bradaczek
Vorrichtung zur Divergenzänderung von Röntgen- oder Neutronenstrahlenbündeln
Offenlegungsschrift DE 37 02 804 A1, Deutsches Patentamt, Az: P 37 02 804.9-33
Anmeldetag: 28.1.87; Offenlegungstag: 11.8.88

G. Hildebrandt, W. Uebach, H. Bradaczek
Deltacrystal - an attempt to improve X-ray optics.
12th European Crystallogr. Meeting, Moscow. Coll. Abstr. Vol. 1 p. 304 (1989)

1990 - 99

H. Bradaczek, G. Hildebrandt, A. Kuhr, B. Nestler
Automatic Sorting Quartz Oscillators
Acta Cryst. A46, PS-01.04.30 (1990)

W. Uebach
Growth of Delta-Crystals for X-ray Optical Devices
Acra Cryst. A46.2, PS-13-03.02 (1990)

B. Nestler, H.-J. Kuhr, G. Hildebrandt, H. Bradaczek
Novel use of a commercial goniometer for sorting round quartz blanks
Meas. Sci. Technol. 2 pp. 528-531 (1991).

Hans Bradaczek
Automated Measuring and Sorting System for Round and Rectangular Quartz Blanks Using X-Ray Diffraction 13th Piezoelectric Conference & Exhibition, Kansas City,
Proceedings, Vol. 1 pp. 14-17 (1991).

Hans Bradaczek
Automated X-Ray Sorting Machine for Round Quartz Blanks
45th Symposium on Frequency Control, Los Angeles,
Proceedings, pp. 114-116 (1991).

Hans Bradaczek, Gerhard Hildebrandt, and S. Moré
X-Ray Scan of the Stones - A Possibility to Reduce Miscutting of Blanks
14th Piezoelectric Devices Conference & Exhibition, Kansas City,
Proceedings, Vol. 1 pp. 83-86 (1992).

W. Uebach, H. Bradaczek, G. Hildebrandt
Attempts to grow Delta-Crystals from binary systems by zone-melting
Abstract&Poster: Sixteenth Congress of the International Union of Crystallography, Beijing, China (1993)

H. U. Baron, E Bayer, L Steinhauser, H Bradaczek and E Wasiewicz
A 13 Axes X-Ray Goniometer for Diffraction Investigations on Large Samples
European Journal of NDT, Vol. 3 No. 1, pp. 17-23 (1993)

Hans Bradaczek and Gerhard Hildebrandt
Improvements in Round Quartz Blank Sorting
15th Piezoelectric Devices Conference & Exhibition, Kansas City,
Proceedings, Vol. 1 pp. 54-57 (1993).

Hans Bradaczek and Gerhard Hildebrandt
X-ray Diffraction of Quartz Crystals (Tutorial).
15th Piezoelectric Devices Conference & Exhibition, Kansas City,
Proceedings, Vol. 1 pp. 44-53 (1993).

Hans Bradaczek, Gerhard Hildebrandt and Wilhelm Uebach
The Use of an X-Ray Three Beam Technique to Improve the Adjustment of Bars for utting
47th Symposium on Frequency Control, Salt Lake City,
Proceedings, pp. 416-419 (1993).

H. Bradaczek, G. Hildebrandt. W. Uebach
Delta-Crystal - a progress in X-ray optics and a challenge for crystal growers
Coll. Abstr. XVIth IUCr Congr. Peking, pp. 374-375 (1993).

W. Uebach, H. Bradaczek, G. Hildebrandt
Attempts to Grow Delta-Crystals from Binary Systems by Zone-Melting
Coll. Abstr. XVIth IUCr Congr. Peking, p.392 (1993).

Hans Bradaczek and Gerhard Hildebrandt
X-Ray Adjustment and Sorting of SC Cut Quartz Blanks
16th Piezoelectric Devices Conference & Exhibition, Kansas City,
Proceedings, Vol. 1 pp. 112-115 (1994).
Bernhard Morys, Hans Bradaczek and Gerhard Hildebrandt
Improved W-Scan for Separate Measurements of True AT-Cutting Angles and X-Miscutting Angles for Round Quartz Blanks
48th Symposium on Frequency Control, Boston, Massachusetts,
Proceedings, pp. 237-240 (1994).

H. Bradaczek
Paracrystals (in memoriam R. Hosemann) (invited paper)
Polymeric materials Encyclopedia, ed. Joseph C. Salomone
CRC Press, Boca Raton, Vol. 7, pp. 4875-4884 (1996)

H. Bradaczek
Some Roots of Diffraction Theory (invited paper)
Oxford University Press (OUP), ed.: Robert Snyder (1996)

H. Bradaczek
Paracrystallinity (invited paper)
Oxforf University Press (OUP), ed.; Robert Snyder (1996)

H. Berger, H. Bradaczek and G. Hildebrandt
X-Ray controlled cutting machine for SC-cut blanks
18th Piezoelectric Devices Conference & Exhibition, Kansas City,
Proceedings, Vol. 1 pp. 39-43 (1996).

H. Berger, H. Bradaczek, H.-A. Bradaczek, and G. Hildebrandt
Application of the W-Scan to the Sorting of Doubly Rotated Quartz Blanks
50th Symposium on Frequency Control, Honolulu, Hawaii,
Proceedings, p. 412-415 (1996).

H. Bradaczek, H. Berger, G. Hildebrandt
Präzisions-Orientierungsbestimmung als Routinemethode: Anwendung auf Schwingquarz.
Z. Kristallogr., Suppl. Issue No. 11 p. 148 (1996).

Hans-Arthur Bradaczek, Tom Lim, and Harald Pianowski
Optical Surface Scan by Laser Device, an Improvement in the Cutting Angle Determination of Round Quartz Blanks
19th Piezoelectric Devices Conference & Exhibition, Kansas City,
Proceedings, Vol. 1 pp. 12-1 - 12-8 (1997).

H. Berger, H. Bradaczek, and G. Hildebrandt
Improvements of the W-Scan Method by Eliminating Systematic Errors
19th Piezoelectric Devices Conference & Exhibition, Kansas City,
Proceedings, Vol. 1 pp. 15-1 - 15-23 (1997).

Hans Bradaczek and Gerhard Hildebrandt
Applications of X-Rays in the Quartz-Oscillator Industry
The Rigaku Journal Vol. 14 No. 1 pp. 12-20 (1997).

M. Bradaczek, H. Bradaczek
Bildrekonstruktion von Computertomographien mit Hilfe der Funktionenalgebra
Aktuelle Radiologie (1997)

M. Popescu, F. Sava, A. Lörinczi, E. Vateva, D. Nesheva, G. Tchaushev, I.N. Mihailescu, P.-J. Koch. S. Obst. H. Bradaczek
Amorphous Se/CdSe and SiO2/CdSe Multilayers
Proceedings of SPIE - The International Society of Optical Engineering ROMOPTO 1997, Fifth Conference on Optics, Bucharest, Romania (1997),
SPIE Vol. 3405, pp. 960-964.

Hans Berger
Improvements of X-Ray Orientation Determination Methods Applicable in Quartz Resonator Industry
Proceedings of the "12th European Frequency and Time Forum", Warschau,
pp. 339-344 (1998).

H. Berger, H. Bradaczek, and G. Hildebrandt
X-ray Control and Adjusting Arrangement for Cutting of SC-Cut Blanks Using Only Two Rotation Axes
20th Piezoelectric Devices Conference & Exhibition, Kansas City,
Proceedings, Vol. 1 pp. 5-1 - 5-4 (1998).

H.-A. Bradaczek, G. Hildebrandt, and H. Pianowski
Extension of the W-Scan for Sorting of Mini-Strip Blanks and of One Inch
Wafers
20th Piezoelectric Devices Conference & Exhibition, Kansas City,
Proceedings, Vol. 1 p. 2-1 (1998).

I. Mataescu, M. Popescu, F. Sava, H. Bradaczek
The Influence of the Electrode Multilayer Structure on the Quartz Resonator Parameters
1999 Joint Meeting of The European Frequency and Time Forum and The
IEEE International Frequency Control Symposium
Besancon, Frankreich. Proceedings, Vol. 1, p. 445-448.

H. Berger, H. Bradaczek, and G. Hildebrandt
Complete X-Ray Orientation Determination of Quartz Bars Using a Small Scanning Range
1999 Joint Meeting of The European Frequency and Time Forum and The
IEEE International Frequency Control Symposium
Besancon, Frankreich. Proceedings, Vol. 2, p.851-854.

M. Popescu, H. Bradaczek
Defects in Non-Crystalline Materials
J. of Optoelectronics and Advanced Materials Vol. 1, No. 1, p. 5-16, March (1999)

H. Bradaczek, G. Hildebrandt
Real X-Ray Optics - A Challenge for Crystal Growers
J. of Optoelectronics and Advanced Materials Vol. 1, No. 2 pp. 3-8, June (1999).

H. Berger, H. Bradaczek, and G. Hildebrandt
Check of the Local Structural Homogeneity of Quartz Specimens by X-Ray Diffraction Methods
21st Piezoelectric Devices Conference & Exhibition, Reno, Nevada,
Proceedings, Vol. 1 pp. 3-1 - 3-4 (1999)

2000 - heute

M. Bradaczek, H. Guski, H. Bradaczek and G. Avtandilov
Determination of the Structure of Tissue Samples Using X-ray Small Angle Scattering
Pathol. Res. Pract. 196: 827-830 (2000)

H. Berger, H.-A. Bradaczek, H. Pianowski, H. Bradaczek, G. Hildebrandt
New Quartz-Blank Sorting Machine including Optical and Extended X-Ray Inspection
Proceedings of the 2000 IEEE/EIA International Frequency Control Symposium & Exhibition, Kansas City, Missouri (2000), p. 247-249.

G. Hildebrandt and H. Bradaczek
Approaching Real X-Ray Optics
The Rigaku Journal Vol. 17, No. 1, pp. 13-22 (2000).

H. Berger, H. Bradaczek, G. Hildebrandt
Rapid X-Ray Quartz Angle Sorting Based on the Laue Method - An Alternative?
15th European Frequency and Time Forum, Neuchatel; Proceedings pp. 342-344 (2001)

S. Georgescu, L. Georghe, M. Popescu, F. Sava, H. Bradaczek
Czochralski Growth Structure and Properties of Langasite (La3Ga5SiO14) Piezoelectric Single Crystals
15th European Frequency and Time Forum, Neuchatel (2001).

H. Berger, H.-A. Bradaczek, H. Bradaczek, G. Hildebrandt
Further Progress in the Absolute Orientation Determination of Doubly Rotated Quartz Blanks by Means of the W-Scan Method
Proc. IEEE Intern. Frequ. Contr. Symp., Seattle, Washington
pp. 393-395 (2001).

H.-A. Bradaczek, H. Bradaczek, H. Pianowski, A.V. Kononovich, G. Hildebrandt
A New Machine for the Automatic Position - Dependent Orientation Measurement of AT-Cut Quartz Wafers
Proc. IEEE Intern. Frequ. Contr. Symp., Seattle, Washington
pp. 390-392 (2001).

G. Hildebrandt and H. Bradaczek
Quartz as the Basic Material for Electronic Oscillators
Annales Francaices des Microtechniques et de Chronométre Tome 50 pp. 107-131 (2001)

H. Bradaczek, G. Hildebrandt
Functional Algebra - an Important Bridge between Diffraction Experiments and their Evolution (Preface)
The Rigaku Journal Vol. 18 No. 1, pp. 1-5 (2001)

G.Hildebrandt, H.Bradaczek
Experiences with Quartz Oscillator Angle-Sorting
Cryst. Res. Technol. 37, 111-118 (2002)

H.Berger
Simulation of X-Ray Reflection Curves in Single Non-Coplanar
Geometry and Its Application
Cryst. Res. Technol. 37, No. 7, 716-726 (2002)

M. Popescu, F. Sava, S.Georgescu, L.Gheorge, I.N. Mihailescu,
R. Cristescu, G.Socol, H.Bradaczek
Thin Films of Langasite (La3Ga5SiO14) Prepared by Pulsed Laser Deposition
J. of Optoelectronics and Advanced Materials Vol. 4, No. 3 p. 813-818 (2002)

H. Berger, H. Bradaczek, G. Hildebrandt
Lattice-Parameter Determination of Quartz by Means of the W-Scan Method
Proc. IEEE Intern. Frequ. Contr. Symp., New Orleans, Louisiana, pp. 420-423 (2002)

H. Berger, H. Bradaczek, G. Hildebrandt
Comparison of Absolute and Relative Cutting-Angle Measurements of AT-Cut Quartz by Means of the W-Scan Method
EFTF St. Petersburg, D-047 (2002)

H. Berger, H. Bradaczek, G. Hildebrandt
Diffraktometersystem zur Orientierungsbestimmung an Einkristallen
11. Jahrestagung der Deutschen Gesellschaft für Kristallographie (DGK)
(10.-13.3.2003); Supplement Issue No. 20; Z. Kristallogr., S. 79

Hans Bradaczek und Gerhard Hildebrandt
Röntgen-Präzisionsmesungen: ein kristallographisches Hilfsmittel für die industrielle Fertigung von Quarzoszillatoren
11. Jahrestagung der Deutschen Gesellschaft für Kristallographie (DGK)
(10.-13.3.2003); Supplement Issue No. 20; Z. Kristallogr., S. 1

H. Berger, H.-A. Bradaczek, H. Bradaczek, G. Hildebrandt
X-Ray Angle Sorting of Small-Size Quartz Blanks Using the W-Scan - State and Perspective
Proc. IEEE Intern. Frequ. Contr. Symp. and PDA Exhibition Jointly with the 17th European Frequency and Time Forum; Tampa (FL), pp. 761-764 (2003)

H.-A. Bradaczek, H. Berger, H. Bradaczek, G. Hildebrandt
The X-Ray Angle Measurement of Doubly Rotated Quartz Blanks with any cutting Angle Using the W-Scan Method
Proc. IEEE Intern. Frequ. Contr. Symp. and PDA Exhibition Jointly with the 7th European Frequency and Time Forum; Tampa (FL), pp. 833-836, (2003)

H. Berger
X-Ray Orientation Determination of Single Crystals by Means of the Omega-Scan Method
J. Phys. IV France 118, pp. 37-42 (2004)

G. Hildebrandt, H. Bradaczek
High Precision Crystal Orientation Measurements with the X-ray Omega-Scan - A Tool for the Industrial Use of Quartz and other Crystals
J. of Optoelectronics and Advanced Materials Vol. 6, No. 1, p. 5-21 (2004)

Seydel, H. Berger, G. Hildebrandt, H. Bradaczek
Lattice Damages in Quartz Crystal Blanks - Influence on the ResonatorProperties and on the X-ray Measurement
IEEE Montreal, 109-116 (2004)

E. Seydel
The different ageing behaviour of fundamental and overtone modes.
The influence of lattice distortion on the temperature frequency dependency.
18th EFTF, University of Surrey, Guildford, UK (2004)

H.Berger, H.Bradaczek, H. Schwabe, G. Hildebrandt
High-Precision Orientation of Single Crystals and Crystal Stacks for a Succeeding Cutting
Gem. Jahrestagung der DGK u. der Deutschen Ges. f. Kristallwachstum u. Kristallzüchtung v. 28.2. - 4.3. 2005 in Köln, S. 186.

H. Berger, H. Bradaczek
X-Ray Orientation System for Silicon Ingots and Wafers
Proc. Silicon 2006, 10th Sci. Bus. Conf., Roznov, Czech Rep., pp. 276-280 (2006)

H. Berger, H.-A. Bradaczek, H. Bradaczek
Omega-Scan: An X-Ray Tool for the Characterization of Crystal Properties
J. Mater. Sci.: Mater. Electron. 19, pp. S351-S335 (2008)
DOI 10.1007/s10854-007-9479-y